Tutorial: On the Practical Aspects of SEM
Marcel Simsek, Institute of Analytical Chemistry, Chemo- and Biosensors, Workgroup Prof. Dr. Baeumner, University of Regensburg
Abstract
Scanning electron microscopy (SEM) is an essential tool in broad fields of modern research. It is especially indispensable in characterization of micro-/nanostructures where limits of standard light microscopy are exceeded, as electron microscopy generally implies accelerated electrons instead of light. This allows resolutions in low nanometres range, which are orders of magnitude lower than that of conventional optical microscopy. Additionally, structural composition differences and their respective distribution within specimens can be enlightened with EM techniques. However, it also necessitates more knowledge and training due to high device complexity.
The aim of this tutorial is to give the audience insights focused on the practical aspects when operating SEM. Theoretical background of SEM will briefly be introduced and the practical implementation will be described step by step from sample preparation to most important imaging parameters and their influence on the picture generation process. Challenges, which are coming up for different samples, will be presented with the associated SEM image examples and potential solutions will be discussed.
a) SEM image of electrodeposited silver nanostructures. Side-view SEM images of b) electrospun polyimide nanofibers before and c) after carbonization with a CO2-laser.
When: Friday 03.07.2020, from 8:30 a.m. to 9:00 a.m.
Where: Online (Zoom)
Link: https://uni-regensburg.zoom.us/j/95893134468?pwd=a1FJTTdnSW5jR0IxM3NWbm9kenVVdz09
Meeting-ID: 958 9313 4468
Password: 335271
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